Title: Exchange bias induced by O ion implantation in ferromagnetic thin films
Authors: Demeter, Joost ×
Menéndez Dalmau, Enric
Schrauwen, Annelore
Teichert, A
Steitz, R
Vandezande, Stijn
Wildes, A. R
Vandervorst, Wilfried
Temst, Kristiaan
Vantomme, André #
Issue Date: 2012
Publisher: Institute of Physics and IOP Publishing
Series Title: Journal of Physics D, Applied Physics vol:45 issue:40
Article number: ARTN 405004
ISSN: 0022-3727
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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