ITEM METADATA RECORD
Title: Design of a sample approach mechanism for a metrological atomic force microscope
Authors: Piot, Jan ×
Qian, Jun
Pirée, Hugo
Kotte, Gerard
Pétry, Jasmine
Kruth, Jean-Pierre
Vanherck, Paul
Van Haesendonck, Chris
Reynaerts, Dominiek #
Issue Date: Jan-2013
Publisher: Elsevier BV
Series Title: Measurement: Journal of the International Measurement Confederation vol:46 issue:1 pages:739-746
Description: http://dx.doi.org/10.1016/j.measurement.2012.09.012
ISSN: 0263-2241
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Production Engineering, Machine Design and Automation (PMA) Section
Solid State Physics and Magnetism Section
× corresponding author
# (joint) last author

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