Title: A 65 nm, 850 MHz, 256 kbit, 4.3 pJ/access, ultra low leakage power memory using dynamic cell stability and a dual swing data link
Authors: Rooseleer, Bram ×
Dehaene, Wim
Cosemans, Stefan #
Issue Date: Jul-2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Journal of Solid-State Circuits vol:47 issue:7 pages:1784-1796
ISSN: 0018-9200
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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