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Title: Wobble-based on-chip calibration circuit for temperature independent oscillators
Authors: De Smedt, Valentijn ×
Steyaert, Wouter
Dehaene, Wim
Gielen, Georges #
Issue Date: 2-Aug-2012
Publisher: Institution of Electrical Engineers
Series Title: Electronics Letters vol:48 issue:16 pages:1000-1001
Abstract: An automatic calibration circuit for temperature- and process-independent oscillators and timing circuits is presented. The circuit monitors the dynamic gate-source voltage of a MOS transistor of which the temperature is changing. By adapting the bias current through this transistor towards the zero-temperature-coefficient point of the VGS, the gate-source voltage can be used in temperature-independent timing circuits. Because of the dynamic nature of this regulation circuit, the technique is insensitive to mismatch and process variations. The presented technique is applied to a low-noise oscillator to make it less temperature sensitive with a factor of 8.
ISSN: 0013-5194
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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