Title: Wobble-based on-chip calibration circuit for temperature independent oscillators
Authors: De Smedt, Valentijn ×
Steyaert, Wouter
Dehaene, Wim
Gielen, Georges #
Issue Date: 2-Aug-2012
Publisher: Institution of Electrical Engineers
Series Title: Electronics Letters vol:48 issue:16 pages:1000-1001
Abstract: An automatic calibration circuit for temperature- and process-independent oscillators and timing circuits is presented. The circuit monitors the dynamic gate-source voltage of a MOS transistor of which the temperature is changing. By adapting the bias current through this transistor towards the zero-temperature-coefficient point of the VGS, the gate-source voltage can be used in temperature-independent timing circuits. Because of the dynamic nature of this regulation circuit, the technique is insensitive to mismatch and process variations. The presented technique is applied to a low-noise oscillator to make it less temperature sensitive with a factor of 8.
ISSN: 0013-5194
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:
File Description Status SizeFormat
Wobble.pdf Published 274KbAdobe PDFView/Open Request a copy

These files are only available to some KU Leuven Association staff members


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science