Microscopy Research and Technique
Publication date:
1998-01-01
Volume:
40
Pages:
492 -
494
Publisher:
Wiley-Liss
Author:
de Wit, E
Walet, MAM ; Celis, Jean-Pierre
Keywords:
preparation technique, TEM, nanocrystalline debris, TiN-coatings, Alloys, Materials Testing, Microscopy, Electron, Microtomy, Titanium, 0299 Other Physical Sciences, 0601 Biochemistry and Cell Biology, 0912 Materials Engineering, Microscopy, 3406 Physical chemistry
Abstract:
A TEM-sample preparation method for small amounts of fretting wear debris is presented. After embedding in a resin, the debris are ultramicrotomed to ultra-thin sections. In this way, valuable observation of nanocrystalline fretting wear debris originating from TiN-coatings could be rapidly obtained.