Title: Degradation-Resilient Design of a Self-Healing xDSL Line Driver in 90 nm CMOS
Authors: De Wit, Pieter ×
Gielen, Georges #
Issue Date: Jul-2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Journal of Solid-State Circuits vol:47 issue:7 pages:1757-1767
ISSN: 0018-9200
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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