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Title: Uncertainty Determination for Dimensional Measurements with Computed Tomography
Authors: Kiekens, Kim
Tan, Ye
Welkenhuyzen, Frank
Kruth, Jean-Pierre
Dewulf, Wim
Issue Date: 19-Sep-2012
Conference: Conference on Industrial Computed Tomography location:Wels, Austria date:19-21 September 2012
Abstract: Due to the availability of increased computational power combined with better X-ray source and detector technologies, the obtainable resolutions now allow to use CT-machines not only for material and medical science, but also for dimensional metrology. However, the transition from visualization to measuring requires calibration steps to ensure that measurements are traceable to the unit of length. There is still a lack of proper standards to calibrate CT machines and to check their performance for dimensional metrology. In addition, there is still room for a better systematic approach for measurement uncertainty determination. Therefore, this paper presents a method to determine the uncertainty of dimensional measurements with industrial CT machines based on the ISO-GUM. Subsequently, some of the uncertainty factors are quantified based on a series of systematic measurements.
Publication status: accepted
KU Leuven publication type: IC
Appears in Collections:Technologiecluster Werktuigkundige Industriƫle Ingenieurstechnieken
Mechanical Engineering Technology TC @ Groep T
Centre for Industrial Management / Traffic & Infrastructure
Production Engineering, Machine Design and Automation (PMA) Section

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