Title: Sense and Non-Sense of Beam Hardening Correction in CT Metrology
Authors: Dewulf, Wim ×
Tan, Ye
Kiekens, Kim #
Issue Date: 18-Apr-2012
Publisher: Elsevier BV
Series Title: CIRP Annals. Manufacturing Technology vol:61 issue:1 pages:495-498
Article number: CIRP779
Abstract: The polychromatic spectrum of X-ray beams causes beam hardening artifacts in reconstructed computed tomography (CT) models. This leads to unwanted grey value variations in CT models, thus hampering accurate material analysis and inspection. Therefore, beam hardening correction algorithms have been developed and improved since the early 1970s, which enhance the CT image quality by compensating for beam hardening effects. However, beam hardening correction often results in less contrast around the edge. In addition, experiments show an increased influence of surrounding material on the object dimensions after segmentation, hence increasing the measurement uncertainty. This paper presents the results of systematic investigations into the effect of beam hardening correction on the measurement accuracy and uncertainty for CT metrology applications.
ISSN: 0007-8506
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Production Engineering, Machine Design and Automation (PMA) Section
Centre for Industrial Management / Traffic & Infrastructure
Mechanical Engineering Technology TC, Campus Group T Leuven
Technologiecluster Werktuigkundige Industriƫle Ingenieurstechnieken
× corresponding author
# (joint) last author

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