Title: Multi-frequency ESR analysis of the E '(delta) defect hyperfine structure in SiO2 glasses
Authors: Stesmans, Andre ×
Jivanescu, Mihaela
Afanas'ev, Valeri #
Issue Date: Jan-2011
Publisher: Editions de Physique
Series Title: Europhysics Letters vol:93 issue:1 pages:1-6
Article number: 16002
Abstract: A multifrequency electron spin resonance study of the E'(delta) defect in six SiO2 glasses irradiated by UV, VUV, or Co-60 gamma-rays, points to an electronically rigid structure with no dynamic rearrangement occurring in the temperature range T >= 4.2K. Reassuringly coinciding over all frequencies and T's applied, the average intensity ratio of the 100G Si-29 hyperfine doublet to the central Zeeman signal points to delocalization of the unpaired spin over n=4 or 5 equivalent Si sites, thus refuting the Si dimer model. A noteworthy revelation is that E'(delta) is only observed in those (3) silica types studied also showing the Al E' center in the as gamma-irradiated state. This may signify some indirect role of charge compensators/traps in activating/stabilizing E'(delta) centers, relevant to further theoretical modeling. Copyright (C) EPLA, 2011
ISSN: 0295-5075
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
× corresponding author
# (joint) last author

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