Title: Area scaling analysis of CMOS ADCs
Authors: Verhelst, Marian ×
Murmann, Boris #
Issue Date: 15-Mar-2012
Publisher: Institution of Electrical Engineers
Series Title: Electronics Letters vol:48 issue:6 pages:314-U70
ISSN: 0013-5194
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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