Title: Conductivity, morphology, interfacial chemistry, and stability of poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate): A photoelectron spectroscopy study
Authors: Crispin, X ×
Marciniak, S
Osikowicz, W
Zotti, G
Van der Gon, AWD
Louwet, F
Fahlman, M
Groenendaal, L
De Schryver, Frans
Salaneck, WR #
Issue Date: Jan-2003
Publisher: John wiley & sons inc
Series Title: Journal of polymer science part b-polymer physics vol:41 issue:21 pages:2561-2583
Abstract: X-ray photoelectron spectroscopy (XPS) has been used to characterize poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDT/PSS), one of the most common electrically conducting organic polymers. A correlation has been established between the composition, morphology, and polymerization mechanism, on the one hand, and the electric conductivity of PEDT/PSS, on the other hand. XPS has been used to identify interfacial reactions occurring at the polymer-on-ITO and polymer-on-glass interfaces, as well as chemical changes within the polymer blend induced by electrical stress and exposure to ultraviolet light. (C) 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 2561-2583, 2003
ISSN: 0887-6266
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Molecular Imaging and Photonics
× corresponding author
# (joint) last author

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