Title: Fluence dependence of ion implantation-induced exchange bias in face centered cubic Co thin films
Authors: Demeter, Joost ×
Menéndez Dalmau, Enric
Temst, Kristiaan
Vantomme, André #
Issue Date: 19-Dec-2011
Publisher: American Institute of Physics
Series Title: Journal of Applied Physics vol:110 issue:12
Article number: 123902
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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