ITEM METADATA RECORD
Title: SPECIAL ISSUE 19th European Symposium on RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS (ESREF 2008)
Authors: Groeseneken, Guido ×
De Wolf, Ingrid
Mouthaan, Anton
Bisschop, Jaap #
Issue Date: Aug-2008
Publisher: Pergamon-elsevier science ltd
Series Title: Microelectronics Reliability vol:48 issue:8-9 pages:1111-1111
URI: 
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Department of Materials Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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