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Title: Characterization of a point-contact on silicon using force microscopy-supported resistance measurements
Authors: Dewolf, P ×
Snauwaert, Johan
Clarysse, T
Vandervorst, Wilfried
Hellemans, Louis #
Issue Date: Jan-1995
Publisher: Amer inst physics
Series Title: Applied Physics Letters vol:66 issue:12 pages:1530-1532
URI: 
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Chemistry - miscellaneous
Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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