Title: Defect-related excess low-frequency noise in Ge-on-Si pMOSFETs
Authors: Simoen, Eddy ×
Mitard, Jerome
De Jaeger, Brice
Eneman, Geert
Dobbie, A
Myronov, M
Leadley, D.R
Meuris, Marc
Hoffmann, Thomas Y
Claeys, Corneel #
Issue Date: Jan-2011
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:32 issue:1 pages:87-89
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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