This item still needs to be validated !
Title: Impact of Ge content and recess depth on the leakage current in strained Si1-xGex/Si heterojunctions
Authors: Luque Rodriguez, Abraham ×
Bargallo Gonzalez, Mireia
Eneman, Geert
Claeys, Corneel
Kobayashi, Daisuke
Simoen, Eddy
Jiménez Tejada, Juan A #
Issue Date: Aug-2011
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:58 issue:8 pages:2362-2370
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science