Title: Processing dependences of channel hot-carrier degradation on strained-S- p-channel metal-oxide semiconductor field-effect transistors
Authors: Amat, E ×
Martin-Martinez, J
Bargallo Gonzalez, Mireia
Rodriguez, R
Nafria, M
Aymerich, X
Verheyen, Peter
Simoen, Eddy #
Issue Date: 2011
Publisher: Published for the Society by the American Institute of Physics
Series Title: Journal of Vacuum Science & Technology B, Microelectronics and Nanometer Structures vol:29 issue:1
Article number: 01AB07
ISSN: 1071-1023
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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