Title: Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
Authors: Eyben, Pierre ×
Seidel, Felix
Hantschel, Thomas
Schulze, Andreas
Lorenz, Anne
Uruena De Castro, Angel
Van Gestel, Dries
John, Joachim
Horzel, Jörg
Vandervorst, Wilfried #
Issue Date: Mar-2011
Publisher: Wiley-VCH Verlag GMBH
Series Title: Physica Status Solidi A, Applications and Materials Research vol:208 issue:3 pages:596-599
ISSN: 1862-6300
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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