Title: Integrated polarization analyzing CMOS image sensor for material classification
Authors: Sarkar, Mukul ×
San Segundo Bello, David
Van Hoof, Chris
Theuwissen, Albert #
Issue Date: Aug-2011
Publisher: IEEE Sensors Council
Series Title: IEEE Sensors Journal vol:11 issue:8 pages:1692-1703
ISSN: 1530-437X
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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