Title: On-chip circuit for massively parallel BTI characterization
Authors: da Silva, Mauricio Banasheski
Kaczer, Ben
Van der Plas, Geert
Wirth, Gilson I
Groeseneken, Guido #
Issue Date: 2011
Publisher: IEEE
Host Document: 2011 ieee international integrated reliability workshop final report (irw) pages:90-93
Conference: IEEE International Integrated Reliability Workshop - IIRW location:Lake Tahoe, CA USA date:10/16/2011
ISBN: 978-1-4577-0115-3
ISSN: 1930-8841
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Non-KU Leuven Association publications
# (joint) last author

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