European Conference on Radiation Effects on Component and Systems - RADECS, Date: 2011/01/09 - 2011/01/19, Location: Sevilla Spain
Publication date:
2011-01-01
Pages:
195 -
201
ISSN:
9781457705878
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Author:
Griffoni, Alessio
Zuber, Paul ; Dobrovolny, Petr ; Roussel, Philippe ; Linten, Dimitri ; Alles, Michael L ; Schrimpf, Ronald D ; Reed, Robert A ; KOBAYASHI, Daisuke ; Simoen, Eddy ; Groeseneken, Guido
Abstract:
Process variation affects the soft-error sensitivity of SRAM cells. A complex dependence on the arrival time of the particle strike relative to the word-line clock is observed. © 2011 IEEE.