| ITEM METADATA RECORD |
| Title: | Stress relaxation empirical model for biaxially strained triple-gate devices |
| Authors: | Trevisoli, R.D
Martino, J.A
Simoen, Eddy
Claeys, Corneel
Pavanello, M.A # |
| Issue Date: | 2011 |
| Host Document: | ADVANCED SEMICONDUCTOR-ON-INSULATOR TECHNOLOGY AND RELATED PHYSICS 15 vol:35 issue:5 pages:289-294 |
| Series Title: | ECS Transactions |
| Conference: | Advanced Semiconductor-on-Insulator Technology and Related Physics location:Montreal Canada date:05/01/2011 |
| ISBN: | 978-1-56677-866-4 |
| Publication status: | published |
| KU Leuven publication type: | IC |
| Appears in Collections: | Non-KU Leuven Association publications
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