ITEM METADATA RECORD
Title: Stress relaxation empirical model for biaxially strained triple-gate devices
Authors: Trevisoli, R.D
Martino, J.A
Simoen, Eddy
Claeys, Corneel
Pavanello, M.A #
Issue Date: 2011
Host Document: ADVANCED SEMICONDUCTOR-ON-INSULATOR TECHNOLOGY AND RELATED PHYSICS 15 vol:35 issue:5 pages:289-294
Series Title: ECS Transactions
Conference: Advanced Semiconductor-on-Insulator Technology and Related Physics location:Montreal Canada date:05/01/2011
ISBN: 978-1-56677-866-4
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Non-KU Leuven Association publications
# (joint) last author

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