ITEM METADATA RECORD |
Title: | Stress relaxation empirical model for biaxially strained triple-gate devices |
Authors: | Trevisoli, R.D Martino, J.A Simoen, Eddy Claeys, Corneel Pavanello, M.A # |
Issue Date: | 2011 |
Host Document: | ADVANCED SEMICONDUCTOR-ON-INSULATOR TECHNOLOGY AND RELATED PHYSICS 15 vol:35 issue:5 pages:289-294 |
Series Title: | ECS Transactions |
Conference: | Advanced Semiconductor-on-Insulator Technology and Related Physics location:Montreal Canada date:05/01/2011 |
ISBN: | 978-1-56677-866-4 |
Publication status: | published |
KU Leuven publication type: | IC |
Appears in Collections: | Non-KU Leuven Association publications
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