Title: A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline silicon
Authors: Chen, J ×
Cornagliotti, Emanuele
Simoen, Eddy
Hieckmann, E
Weber, J
Poortmans, Jozef #
Issue Date: Aug-2011
Publisher: Wiley - V C H Verlag GmbH & Co. KGaA
Series Title: Physica Status Solidi. Rapid Research Letters vol:5 issue:8 pages:277-279
ISSN: 1862-6254
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - ELECTA, Electrical Energy Computer Architectures
× corresponding author
# (joint) last author

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