Title: Unravelling the mysteries of HEMT degradation
Authors: Marcon, Denis ×
Kauerauf, Thomas
Decoutere, Stefaan #
Issue Date: 2011
Publisher: Angel Business Communications Ltd.
Series Title: Compound Semiconductor vol:17 issue:4 pages:14-19
ISSN: 1096-598X
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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