Title: A deep level transient spectroscopy comparison of the SiO2/Si and Al2O3/Si interface states
Authors: Simoen, Eddy
Rothschild, Aude
Vermang, Bart
Poortmans, Jozef
Mertens, Robert Pierre
Issue Date: 2011
Host Document: PHOTOVOLTAICS FOR THE 21ST CENTURY 7 vol:41 issue:4 pages:37-44
Conference: Photovoltaics for the 21st Century 7 location:Boston, MA USA date:10/09/2011
ISBN: 978-1-60768-258-5
ISSN: 1938-5862
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - ELECTA, Electrical Energy Computer Architectures
Electrical Engineering - miscellaneous

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