Title: The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps
Authors: Grasser, Tibor ×
Kaczer, Ben
Goes, Wolfgang
Reisinger, Hans
Aichinger, Thomas
Hehenberger, Phillip
Wagner, Paul-Jurgen
Schanovsky, Franz
Franco, Jacopo
Toledano Luque, Maria
Nelhiebel, M #
Issue Date: 2011
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:58 issue:11 pages:3652-3666
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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