|ITEM METADATA RECORD
|Title: ||Low-frequency noise assessment of CMOS transistros with a through-silicon via|
|Authors: ||Simoen, Eddy|
Van der Plas, Geert
|Issue Date: ||2011 |
|Host Document: ||ULSI Process Integration 7 vol:41 issue:7 pages:385-392|
|Conference: ||7th Symposium on ULSI Process Integration at the 220th Meeting of the Electrochemical-Society (ECS) location:Boston, Ma USA date:09-14 October 2011|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
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