Title: Radiation hardness of SiGe and Ge-based CMOS technologies
Authors: Claeys, Corneel
Iacvo, C
Mitard, Jerome
Arora, R
Zhang, C
Galloway, K
Fleetwood, D
Schrimpf, R
Poizat, M
Simoen, Eddy
Issue Date: 2011
Publisher: Electrochemical Society, Inc
Host Document: Electrochemical Society Transactions - ECS Transactions vol:39 issue:1 edition:17 pages:30
Conference: 26th Symposium on Microelectronics Technology and Devices - SBMicro location:Joao Pessoa Brazil date:08/30/2011
ISSN: 1938-5862
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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