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Title: Proton-induced mobility degradation in FinFETs with stressor layers and strained SOI substrates
Authors: Kobayashi, Daisuke ×
Simoen, Eddy
Put, Sofie
Griffoni, Alessio
Poizat, Marc
Hirose, Kazuyuki
Claeys, Corneel #
Issue Date: Jun-2011
Publisher: Professional Technical Group on Nuclear Science
Series Title: IEEE Transactions on Nuclear Science vol:58 issue:3 pages:800-807
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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