Title: GaN-based HEMTs tested under high temperature storage test
Authors: Marcon, Denis ×
Kang, Xuanwu
Viaene, John
Van Hove, Marleen
Srivastava, Puneet
Decoutere, Stefaan
Mertens, Robert Pierre
Borghs, Gustaaf #
Issue Date: Sep-2011
Series Title: Microelectronics Reliability vol:51 issue:Nov 09 pages:1717-1720
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
Electrical Engineering - miscellaneous
Semiconductor Physics Section
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science