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Title: Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
Authors: Kilchytska, V ×
Alvarado, J
Collaert, Nadine
Rooyackers, Rita
Put, Sofie
Simoen, Eddy
Claeys, Corneel
Flandre, D #
Issue Date: May-2011
Publisher: Pergamon Press
Series Title: Solid-State Electronics vol:59 issue:1 pages:18-24
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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