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|ITEM METADATA RECORD
|Title: ||Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs|
|Authors: ||Kilchytska, V ×|
Flandre, D #
|Issue Date: ||May-2011 |
|Publisher: ||Pergamon Press|
|Series Title: ||Solid-State Electronics vol:59 issue:1 pages:18-24|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Non-KU Leuven Association publications|
× corresponding author|
# (joint) last author|
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