Title: Low-frequency noise characterizations of strained germanium pMOSFETs
Authors: Simoen, Eddy ×
Mitard, Jerome
De Jaeger, Brice
Eneman, Geert
Dobbie, A
Myronov, M
Whall, T
Leadly, D
Meuris, Marc
Hoffmann, Thomas Y
Claeys, Corneel #
Issue Date: 2011
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:58 issue:9 pages:3132-3139
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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