Growth and structure of buffer layers for high temperature superconducting films
Frohlich, K × Rosova, A Machajdik, D Souc, J Figueras, A Weiss, F Chenevier, B Snauwaert, Johan #
Polish acad sciences inst physics
Acta physica polonica a vol:92 issue:1 pages:255-258
We have studied thin CeO2 buffer layers prepared by aerosol MOCVD on (<1(1)over bar 02>) Al2O3 substrate at high deposition temperature, Td = 900 degrees C. A texture analysis by X-ray diffraction showed a high degree of epitaxial character of CeO2 films. A study of the microstructure by transmission electron microscopy revealed that the CeO2 films are in a relaxed state being composed of slightly misoriented blocks surrounded by dislocations. The films are smooth, giving mean square root values of the surface roughness measured by atomic force microscopy up to 1 nm.