Title: Evaluating the Noise in Electrically Evoked Compound Action Potential Measurements in Cochlear Implants
Authors: Undurraga Lucero, Jaime ×
Carlyon, Robert P.
Wouters, Jan
Van Wieringen, Astrid #
Issue Date: Jul-2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on bio-medical engineering vol:59 issue:7 pages:1912-1923
Abstract: Abstract—Electrically Evoked Compound Action Potentials (ECAPs) are widely used to study the excitability of the auditory nerve (AN) and stimulation properties in cochlear implant (CI) users. However, ECAP detection can be difficult and very subjective at near-threshold stimulation levels or when stimulation parameters are modified (e.g. electrode position, rate and pulse width (PW)). In this study, we evaluated the statistical properties of the background noise (BN) and the post-average residual noise (RN) in ECAP measurements in order to determine a more objective detection criterion. For the estimation of the BN and the RN a method currently used in auditory brainstem response (ABR) measurements was applied. The potential benefit of using weighted (Bayesian) averages was also examined. All estimations were performed with a set of approximately 360 ECAP measurements recorded from 5 human CI users of the CII or HiRes90K device (Advanced Bionics). Results demonstrate that the BN was normally distributed and the RN decreased accordingly. No additional benefit was observed by using weighted averaging. The noise power was not significantly different either at different stimulation intensities or across recording electrodes along the cochlea. The analysis of the statistical properties of the noise indicated that a signal-to-noise ratio (SNR) of 1.7 dB as a detection criterion corresponds to a false positive detection rate of 1% with the used measurement setup
ISSN: 0018-9294
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Research Group Experimental Oto-rhino-laryngology
× corresponding author
# (joint) last author

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