Title: Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation
Authors: Merckling, C. ×
Chang, Y.
Lu, C.
Penaud, J.
Brammertz, G.
Scarrozza, M.
Pourtois, G.
Kwo, J.
Hong, M.
Dekoster, J.
Meuris, M.
Heyns, Marc
Caymax, M. #
Issue Date: Oct-2011
Publisher: North-Holland Pub. Co.
Series Title: Surface Science vol:605 issue:19-20 pages:1778-1783
ISSN: 0039-6028
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Department of Materials Engineering - miscellaneous
× corresponding author
# (joint) last author

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