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Title: Dimensioning of open-ended coaxial probes for the dielectric characterization of thin-layered materials
Authors: Stevens, Nobby
Martens, Luc #
Issue Date: 2001
Publisher: Ieee
Host Document: Imtc/2001: proceedings of the 18th ieee instrumentation and measurement technology conference, vols 1-3 pages:1288-1290
Series Title: IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, PROCEEDINGS
Conference: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) BUDAPEST, HUNGARY, MAY 21-23, 2001
Abstract: In this paper, the main results of the modeling of an open ended coaxial probe on a thin layer are shown. If measurements on a multilayered structure are performed, it is important to know in how far the lower layers are detected by the probe. In this paper, a numerical method is used based on a full-wave solution for an open ended coaxial probe. Knowing the thickness of the upper layer gives immediately an idea of the dimensions of the probe if one only wants to measure the properties of this upper layer.
ISBN: 0-7803-6646-8
ISSN: 1091-5281
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Non-KU Leuven Association publications
# (joint) last author

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