Title: A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology
Authors: Kiekens, Kim ×
Welkenhuyzen, Frank
Tan, Ye
Bleys, Philip
Voet, André
Kruth, Jean-Pierre
Dewulf, Wim #
Issue Date: Sep-2011
Publisher: IOP Pub.
Series Title: Measurement Science & Technology vol:22 pages:1-7
Abstract: While computed tomography (CT) has long been used for medical applications and material
inspection, its application field has recently been broadened to include industrial dimensional
metrology. However, the accuracy of CT-based measurements remains yet largely uncertain.
Not only are the measurements influenced by a number of factors and parameters like e.g.
workpiece orientation, magnification, edge detection and so on, but also the calibration method
matters greatly. This paper investigates the influence of these factors and parameters and the
calibration method (rescaling and correction) on accuracy and repeatability of the
measurements, using a test object with parallel grooves. The test object is also used to
illustrate how more accurate CMM measurements can be used to calibrate CT measurements
and to compare different calibration and compensation strategies.
ISSN: 0957-0233
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Production Engineering, Machine Design and Automation (PMA) Section
Centre for Industrial Management / Traffic & Infrastructure
Mechanical Engineering Technology TC, Technology Campus De Nayer Sint-Katelijne-Waver
Mechanical Engineering Technology TC, Campus Group T Leuven
Technologiecluster Werktuigkundige Industriële Ingenieurstechnieken
× corresponding author
# (joint) last author

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