Title: Degradation of supercoiled plasmid DNA within a capillary device
Authors: Meacle, F. J * ×
Zhang, H *
Papantoniou, Ioannis
Ward, J. M
Titchener-Hooker, N. J
Hoare, M #
Issue Date: Aug-2007
Publisher: Wiley
Series Title: Biotechnology and Bioengineering vol:97 issue:5 pages:1148-1157
Abstract: Supercoiled plasmid DNA is susceptible to fluid stress in large-scale manufacturing processes. A capillary device was used to generate controlled shear conditions and the effects of different stresses on plasmid DNA structure were investigated. Computational fluid dynamics (CFD) analysis was employed to characterize the flow environment in the capillary device and different analytical techniques were used to quantify the DNA breakage. It was found that the degradation of plasmid DNA occurred at the entrance of the capillary and that the shear stress within the capillary did not affect the DNA structure. The degradation rate of plasmids was well correlated with the average elongational strain rate or the pressure drop at the entrance region. The conclusion may also be drawn that laminar shear stress does not play a significant role in plasmid DNA degradation.
ISSN: 0006-3592
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
* (joint) first author
× corresponding author
# (joint) last author

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