Title: In-deep insight into the extrinsic capacitance impact on GaN HEMT modeling at millimeter-wave band
Authors: Crupi, Giovanni
Schreurs, Dominique ×
Caddemi, A.
Raffo, A.
Vanaverbeke, F.
Avolio, Gustavo
Vannini, G.
De Raedt, W. #
Issue Date: May-2012
Publisher: Wiley
Series Title: International Journal of Rf and Microwave Computer-Aided Engineering vol:22 issue:3 pages:308-318
ISSN: 1096-4290
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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