Title: Cross-cell Interference Variability Aware Model of Fully Planar NAND Flash Memory Including Line Edge Roughness
Authors: Poliakov, Pavel ×
Blomme, Pieter
Miranda Corbalan, Miguel
Van Houdt, Jan
Dehaene, Wim #
Issue Date: 15-May-2011
Series Title: Microelectronics Reliability vol:51 issue:5 pages:919-924
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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