Title: A CMOS circuit for evaluating the NBTI over a wide frequency range
Authors: Fernandez-Garcia, Raul ×
Kaczer, Ben
Groeseneken, Guido #
Issue Date: Aug-2009
Publisher: Elsevier
Series Title: Microelectronics Reliability vol:49 issue:8 pages:885-891
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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