Title: Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks
Authors: Amat, Esteve ×
Kauerauf, Thomas
Degraeve, Robin
De Keersgieter, An
Rodríguez, Rosana
Nafría, Montse
Aymerich, Xavier
Groeseneken, Guido #
Issue Date: Sep-2009
Publisher: IEEE
Series Title: IEEE Transactions on Device and Materials Reliability vol:9 issue:3 pages:425-430
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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