|ITEM METADATA RECORD
|Title: ||Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple FinFETs|
|Authors: ||dos Santos, S.D|
Claeys, Cor #
|Issue Date: ||2010 |
|Publisher: ||Braz. Microelectronics Society|
|Series Title: ||Journal of Integrated Circuits and Systems vol:5 issue:2 pages:154-159|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
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