Title: Electrical TCAD simulation of a germanium pMOSFET technology
Authors: Hellings, Geert ×
Eneman, Geert
Krom, Raymond
De Jaeger, Brice
Mitard, Jerome
De Keersgieter, An
Hoffmann, Thomas Y
Meuris, Marc
De Meyer, Kristin #
Issue Date: Oct-2010
Publisher: IEEE
Series Title: IEEE Transactions on Electron Devices vol:57 issue:10 pages:2539-2546
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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