Title: Degradation of SiC-MESFETs by irradiation
Authors: Ohyama, H
Takakura, K
Uemura, K
Shigaki, K
Kudou, T
Matsumoto, T
Arai, M
Kuboyama, S
Kamezawa, C
Simoen, Eddy
Claeys, Cor #
Issue Date: 2008
Publisher: Springer
Series Title: Journal of Materials Science: Materials in Electronics vol:19 issue:2 pages:175-178
ISSN: 0957-4522
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
# (joint) last author

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