|ITEM METADATA RECORD
|Title: ||Degradation of SiC-MESFETs by irradiation|
|Authors: ||Ohyama, H|
Claeys, Cor #
|Issue Date: ||2008 |
|Series Title: ||Journal of Materials Science: Materials in Electronics vol:19 issue:2 pages:175-178|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.
© Web of science