ITEM METADATA RECORD
Title: Strain influence of analog performance of single-gate and FinFET SOI nMOSFETs
Authors: Martino, J.A
Pavanello, M.A
Simoen, Eddy
Claeys, Cor #
Issue Date: 2008
Host Document: Proceedings of the 9th International Conference on Solid-State and Integrated-Circuit Technology - IC-SICT
Conference: 9th International Conference on Solid-State and Integrated-Circuit Technology - IC-SICT location:Beijing China date:20-okt-2008
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
# (joint) last author

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