Title: Improvement in NBTI reliability of Si-passivated Ge/high-k/metal-gate pFETs
Authors: Kaczer, Ben
Franco, Jacopo
Mitard, Jerome
Roussel, Philippe
Veloso, Anabela
Groeseneken, Guido #
Issue Date: Jun-2009
Publisher: Elsevier
Series Title: Microelectronic Engineering vol:86 issue:7-9 pages:1582-1584
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
# (joint) last author

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