Title: Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures
Authors: Amat, Esteve ×
Kauerauf, Thomas
Degraeve, Robin
Rodríguez, Rosana
Nafría, Montse
Aymerich, Xavier
Groeseneken, Guido #
Issue Date: Sep-2009
Publisher: IEEE
Series Title: IEEE Transactions on Device and Materials Reliability vol:9 issue:3 pages:454-458
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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