ITEM METADATA RECORD
Title: Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p- channel MuGFETs
Authors: Rodrigues, M
Martino, J.A
Mercha, Abdelkarim
Collaert, Nadine
Simoen, Eddy
Claeys, Cor #
Issue Date: 2010
Publisher: Pergamon
Series Title: Solid-State Electronics vol:54 issue:12 pages:1592-1597
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
# (joint) last author

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