|ITEM METADATA RECORD
|Title: ||Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p- channel MuGFETs|
|Authors: ||Rodrigues, M|
Claeys, Cor #
|Issue Date: ||2010 |
|Series Title: ||Solid-State Electronics vol:54 issue:12 pages:1592-1597|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
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