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Title: Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices
Authors: Magnone, Paolo
Subramanian, Vaidy
Parvais, Bertrand
Mercha, Abdelkarim
Pace, Calogero
Dehan, Morin
Decoutere, Stefaan
Groeseneken, Guido
Crupi, Felice
Pierro, Silvio #
Issue Date: 2008
Publisher: Elsevier
Series Title: Microelectronic Engineering vol:85 issue:3 pages:1728-1731
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
# (joint) last author

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